IEEE 660-1986

$32.00

IEEE Standard for Semiconductor Memory Test Pattern Language
standard by IEEE, 02/18/1986

Document Format: PDF

Description

New IEEE Standard – Inactive-Withdrawn.

Product Details

Published:
02/18/1986
ISBN(s):
9781504404129
Number of Pages:
14
File Size:
1 file , 3.3 MB
Product Code(s):
STDWD10413
Note:
This product is unavailable in Russia, Belarus