Description
Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure
Product Details
- Edition:
- 1.0
- Published:
- 03/29/2007
- Number of Pages:
- 43
- File Size:
- 1 file , 720 KB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
