Description
IEC 60749-17 is used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
Product Details
- Edition:
- 2.0
- Published:
- 03/28/2019
- Number of Pages:
- 17
- File Size:
- 1 file , 1000 KB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
