Description
1.1 This practice covers the information needed to describe and report instrumentation, specimen parameters, experimental conditions, and data reduction procedures. SIMS sputter depth profiles can be obtained using a wide variety of primary beam excitation conditions, mass analysis, data acquisition, and processing techniques (1-4).2
Product Details
- Published:
- 11/01/2019
- Number of Pages:
- 3
- File Size:
- 1 file , 110 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
