Description
1.1 This guide covers procedures used for depth profiling in Auger electron spectroscopy.
1.2 Guidelines are given for depth profiling by the following:
| Section | |
| Ion Sputtering | 6 |
| Angle Lapping and Cross-Sectioning | 7 |
| Mechanical Cratering | 8 |
| Nondestructive Depth Profiling | 9 |
1.3 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
Product Details
- Published:
- 05/10/2003
- Number of Pages:
- 5
- File Size:
- 1 file , 56 KB
- Redline File Size:
- 2 files , 95 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
